Food Engineering

Large bin scanner

November 1, 2010




BinMaster Level Controls’ MVL multiple scanner system integrates multiple point measurement data from two 3D level scanners to cover a wide surface area and provide better inventory accuracy for large vessels. Designed specifically for the challenges of very large bins, the system displays a visual representation of the material surface that shows high and low points in the bin-for example, cone up, cone down, sidewall buildup or bridging.

BinMaster; 800-278-4241; www.binmaster.com